This is an example of a simple test application (development and implementation time - less than one week). The test station was developed for a Fortune 500 semiconductor device manufacturer. The product to be tested was solid state accelerometers used in active suspensions of automobiles. During the test, the accelerometers were mounted on a vibration stand together with a reference accelerometer of a different type. Output voltages from both the device under test (DUT) and the reference unit were acquired by a plug-in board. Both signals were filtered, relative phase shift removed, and the dependence of the DUT output voltage as a function of the acceleration obtained (the acceleration was calculated based on the reference accelerometer output voltage). After that, various specification parameters were extracted from the obtained dependence and compared against the acceptance vaules. Based on the comparison results, the DUT was either accepted or rejected. Test data were saved to a log file.

The front panel of the test station shows data acquisition parameters, raw and filtered data the dependence of the accelerometer output on the acceleration and the details and results of the Pass/Fail analysis